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Simulation Study on Impedance Spectroscopy of Cables of Various Aging Statuses and with Local Defects

机译:各种老化状态局部缺陷电缆的阻抗谱模拟研究

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Existing cable insulation condition assessment technologies, such as Dielectric Loss (tanδ) measurement and Partial Discharge (PD) Monitoring can only reflect the integral condition of, or local defects in, a cable circuit. From late 1990’s, the cable impedance spectroscopy (CIS) method, a measure of the magnitude and phase angle of impedance over a range of frequencies, has been explored for cable condition assessment and fault detection. The paper aims to build on previous research and present an in-depth study of the CIS method for use in condition assessment of total insulation and to investigate its ability to detect and locate the positions of local defects. Simulation results indicated that the objectives can be achieved via CIS. General insulation aging and local defects both cause decreases in the amplitude of cable impedance and increase or shift in the phase of cable impedance. General aging of insulation and the existence of local defects can be distinguished via the rate of decline of the magnitude of CIS. By comparing the integral operations on the CIS results of a healthy cable and the ones having a insulation of general aging and with defects at a series of pre-set locations, criteria are established to locate local defects.
机译:现有的电缆绝缘状况评估技术,例如介电损耗(tanδ)测量和局部放电(PD)监控,只能反映电缆电路的整体状况或局部缺陷。从1990年代后期开始,电缆阻抗谱(CIS)方法(一种在一定频率范围内测量阻抗大小和相位角的方法)已被探索用于电缆状态评估和故障检测。本文旨在以先前的研究为基础,并深入研究用于整体绝缘状态评估的CIS方法,并研究其检测和定位局部缺陷位置的能力。仿真结果表明,可以通过CIS实现目标。一般的绝缘老化和局部缺陷都会导致电缆阻抗的幅度减小,并且电缆阻抗的相位增加或偏移。绝缘体的一般老化和局部缺陷的存在可以通过CIS幅度的下降速率来区分。通过比较在正常电缆的CIS结果和具有一般老化绝缘并且在一系列预设位置处有缺陷的电缆的CIS结果上的整体操作,可以建立定位局部缺陷的标准。

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