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An Investigation on the Dielectric Properties of Thermally-Aged Kapton and its Capability to Withstand Partial Discharges

机译:热老化Kapton的介电性能及其承受局部放电的能力的研究

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The behavior of Kapton CR 200 was investigated as a function of time under thermal aging. Foils of Kapton were kept in the oven at 270 °C and extracted every 48 hours to test their electrical properties. The aim of the investigation was to understand the impact of thermal aging on the partial discharge inception voltage and Kapton’s endurance to partial discharge bombardment. The results highlight that after about 800 hours of aging the PDIV at 10 kHz decreases by 10%, whereas the other dielectric properties tend to show non-monotone behavior. The effect of thermal aging on PDIV seems to be a combined effect of a change in the Kapton permittivity and other factors that we were not fully able to highlight so far.
机译:在热老化条件下,研究了Kapton CR 200的行为与时间的关系。将Kapton的箔放在270°C的烤箱中,每48小时提取一次以测试其电性能。研究的目的是了解热老化对局部放电起始电压的影响以及Kapton对局部放电轰击的承受力。结果表明,老化大约800小时后,PDIV在10 kHz时下降了10%,而其他介电特性则倾向于表现出非单调行为。热老化对PDIV的影响似乎是Kapton介电常数和其他因素的综合影响,到目前为止,我们还不能完全强调这些因素。

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