首页> 外文会议>Design, Automation and Test in Europe Conference and Exhibition >Deep Learning-Based Circuit Recognition Using Sparse Mapping and Level-Dependent Decaying Sum Circuit Representations
【24h】

Deep Learning-Based Circuit Recognition Using Sparse Mapping and Level-Dependent Decaying Sum Circuit Representations

机译:使用稀疏映射和依赖于电平的衰减总和表示法的基于深度学习的电路识别

获取原文

摘要

Efficiently recognizing the functionality of a circuit is key to many applications, such as formal verification, reverse engineering, and security. We present a scalable framework for gate-level circuit recognition that leverages deep learning and a convolutional neural network (CNN)-based circuit representation. Given a standard cell library, we present a sparse mapping algorithm to improve the time and memory efficiency of the CNN-based circuit representation. Sparse mapping allows encoding only the logic cell functionality, independently of implementation parameters such as timing or area. We further propose a data structure, termed level-dependent decaying sum (LDDS) existence vector, which can compactly represent information about the circuit topology. Given a reference gate in the circuit, an LDDS vector can capture the function of the gates in the input and output cones as well as their distance (number of stages) from the reference. Compared to the baseline approach, our framework obtains more than an-order-of-magnitude reduction in the average training time and 2× improvement in the average runtime for generating CNN-based representations from gate-level circuits, while achieving 10% higher accuracy on a set of benchmarks including EPFL and ISCAS'85 circuits.
机译:有效识别电路的功能是许多应用的关键,例如形式验证,逆向工程和安全性。我们提出了一种用于门级电路识别的可扩展框架,该框架利用了深度学习和基于卷积神经网络(CNN)的电路表示形式。给定一个标准的单元库,我们提出了一种稀疏映射算法来提高基于CNN的电路表示的时间和存储效率。稀疏映射仅允许对逻辑单元功能进行编码,而与实现参数(例如时序或区域)无关。我们进一步提出了一种数据结构,称为电平相关衰减和(LDDS)存在向量,它可以紧凑地表示有关电路拓扑的信息。给定电路中的参考门,LDDS向量可以捕获输入和输出锥中的门功能以及它们与参考之间的距离(级数)。与基线方法相比,我们的框架从门级电路生成基于CNN的表示形式时,平均训练时间减少了超过一个数量级,平均运行时间减少了2倍,同时准确性提高了10%根据包括EPFL和ISCAS'85电路在内的一组基准。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号