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Life Expectancy and Future Performance of SiR and EPDM Nonceramic Insulators Through FTIR Spectroscopy and Analytical Methods

机译:SiR和EPDM非陶瓷绝缘子的FTIR光谱和分析方法的预期寿命和未来性能

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In this paper, Nonceramic Insulator (NCI) life expectancy and future performance are evaluated by exposing Silicone Rubber (SiR) and Ethylene Propylene Diene Monomer (EPDM) based insulators to weathering and accelerated aging testing techniques. The tracking wheel test is the aging method selected to assess the NCI insulators’ resistance to tracking and erosion under high pollution. Such aging and degradation process was evaluated utilizing Fourier Transform InfraRed (FTIR) spectroscopy as well as visual inspection testing techniques. The test results were analytically analyzed by employing linear regression statistical method.
机译:本文通过将基于硅橡胶(SiR)和基于乙烯丙烯二烯单体(EPDM)的绝缘子暴露在耐候和加速老化测试技术中,来评估非陶瓷绝缘子(NCI)的预期寿命和未来性能。跟踪轮测试是一种老化方法,用于评估NCI绝缘子在高污染下的抗跟踪和腐蚀能力。使用傅立叶变换红外(FTIR)光谱以及目视检查测试技术对这种老化和降解过程进行了评估。采用线性回归统计方法对测试结果进行了分析。

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