首页> 外文会议>IEEE International Ultrasonics Symposium >The Influence of Negative Ions Generation on the Arc-Melted and Hot Press Sintered Scal Alloy Targets to the Crystalline Orientation and kt2 of the Scaln Films
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The Influence of Negative Ions Generation on the Arc-Melted and Hot Press Sintered Scal Alloy Targets to the Crystalline Orientation and kt2 of the Scaln Films

机译:负离子的产生对电弧熔化和热压烧结鳞片合金靶材的影响,对头皮膜的晶体取向和k t 2

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Film Bulk Acoustic Resonator (FBAR) will become commonplace for the frequency filter used in mobile communication. AIN films were used for piezoelectric material of FBAR. High piezoelectricity of ScAlN films have attracted much attention as FBAR material. However, negative ion generation at Sc metal target induces degradation of the crystallinity due to the ion bombardment on ScAlN films during the sputtering growth. Large amount of O- and CN- ions generation at sputtering target were observed. In this study, we compared the energy distributions of negative ions of arc-melted and sintered ScAl alloy targets which have different oxygen and carbon concentration. The c-axis orientation and electromechanical coupling coefficient kt2 of ScAlN films fabricated with these different targets were also compared. As a result, the kt2 of two targets was larger than our previous report. There were the large differences in amount of O- and CN- ions generation in the two targets. However, it does not significantly affect the results of the crystallization and kt2 of the ScAlN films.
机译:薄膜体声谐振器(FBAR)对于移动通信中使用的频率滤波器将变得司空见惯。 AIN膜用于FBAR的压电材料。作为FBAR材料,ScAlN薄膜的高压电性引起了人们的广泛关注。但是,由于在溅射生长过程中ScAlN膜上的离子轰击,在Sc金属靶上产生负离子会导致结晶度降低。大量的O - 和CN - 观察到在溅射靶上产生离子。在这项研究中,我们比较了具有不同氧和碳浓度的电弧熔化和烧结ScAl合金靶的负离子能量分布。 c轴方向和机电耦合系数kt 2 还比较了用这些不同靶材制造的ScAlN膜的数量。结果,kt 2 两个目标的比例大于我们先前的报告。 O含量差异很大 - 和CN - 在两个目标中产生离子。但是,它不会显着影响结晶和kt的结果。 2 ScAlN膜。

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