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Fast Monolithic Detector Calibration Method - a simulation study

机译:快速整体检测器校准方法-仿真研究

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We have developed a fast detector calibration method, which is capable of calibration of monolithic crystal detectors fast and conveniently. This method could potentially be used to achieve the DOI calibration information of a thick detector. Compared with traditional calibration method, this calibration technique doesnt require a well-collimated pencil beams, and can calibrate a detector in reduced time with fan beams. After the collection of the calibration reference dataset, we propose a data-processing method called common-data subset (CDS) method to acquire the reference datasets as if they were acquired using a pencil beam or even as if there is a single-point light source scanning inside the scintillator. If using fan beams, only 2N scans (in x and y directions) are necessary to calibrate the whole detector surface instead of doing N2 scans using pencil gamma-ray beam. For calibration of the DOI information, 3N scans are necessary, within which the last set of N scans are done with slant beams. Monte-Carlo simulation has been done to support the feasibility of this method, which enables simple, fast and robust calibration for monolithic crystal detectors.
机译:我们开发了一种快速的检测器校准方法,该方法能够快速方便地校准单片晶体检测器。该方法可能潜在地用于获得厚检测器的DOI校准信息。与传统的校准方法相比,该校准技术不需要准直的笔形光束,并且可以用扇形光束在较短的时间内校准检测器。在收集了校准参考数据集之后,我们提出了一种称为公共数据子集(CDS)方法的数据处理方法,以获取参考数据集,就像它们是使用笔形光束采集的,甚至是单点光源一样。闪烁器内部的源扫描。如果使用扇形光束,则只需要进行2N次扫描(沿x和y方向)即可校准整个检测器表面,而不需要进行N次扫描。 2 使用铅笔伽马射线束进行扫描。为了校准DOI信息,必须进行3N次扫描,其中最后一组N次扫描是使用倾斜光束进行的。已经进行了蒙特卡洛模拟,以支持该方法的可行性,该方法可以对单片晶体检测器进行简单,快速和可靠的校准。

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