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A 100MS/S 12-bit Coarse-Fine SAR ADC with Shared Split-CDAC

机译:具有共享的Split-CDAC的100MS / S 12位粗精细SAR ADC

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A 100MS/s 12-bit SAR ADC designed for terahertz imaging sensor is presented. The proposed ADC utilizes coarse-fine SAR architecture to relax reference requirement and improve operation rate. Split-CDAC structure is applied to reduce chip area, and its LSBs capacitors are reused as a coarse DAC. Redundant capacitor arrays are applied in both coarse and fine ADCs. A power-and-area-efficient ADC with high sampling rate can be realized with these techniques combined. The prototype is implemented in TSMC 1P9M 65nm-CMOS process. The simulation result with noise and other on board non-ideal effects shows that the ADC consumes 1.8 mW with an SNDR 65.7 dB and an SFDR of 77.0 dB with a Nyquist input at 1.2V power supply, achieving an ENOB of 10.6-bit and a FoM of 11.6 fJ/conv-step.
机译:提出了一种用于太赫兹成像传感器的100MS / s 12位SAR ADC。拟议的ADC利用粗细SAR架构来放宽参考要求并提高工作速率。采用分离式CDAC结构以减小芯片面积,其LSB电容器被用作粗略DAC。粗电容和细ADC均采用了冗余电容器阵列。结合这些技术,可以实现具有高采样率的功率和面积效率ADC。该原型在台积电1P9M 65nm-CMOS工艺中实现。具有噪声和其他板上非理想影响的仿真结果表明,ADC的功耗为1.8 mW,SNDR为65.7 dB,SFDR为77.0 dB,在1.2V电源下的奈奎斯特输入,实现了10.6位的ENOB和FoM为11.6 fJ /转换步长。

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