A Plotter-Based Automatic Measurement System for Multiple Discrete Power Devices

摘要

We propose an automatic measurement system for measuring multiple packaged power devices. Our system sequentially measures arranged power devices using a robot arm on an XY plotter. The proposed measurement system facilitates the characterization of multiple power devices. Through experiments using 70 SiC power MOSFETs, we demonstrate that our measurement system achieves comparable accuracy and precision to the individual measurement results obtained by an existing curve tracer.