This paper proposes a novel Bayesian approach for stochastic site characterization. The one dimensional (1-D) high-resolution corrected cone tip resistance field obtained from piezocone tests and 2-D low-resolution shear wave velocity field obtained from multichannel analysis of surface waves (MASW) are combined. The outputs are 2-D high-resolution corrected cone tip resistance fields. The proposed method is applied to a synthetic example. The results show that by gradually incorporating more measurements, the uncertainty of soil profile is substantially reduced.
展开▼
