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Specific emitter identification using fractal features based on box-counting dimension and variance dimension

机译:使用基于盒数维和方差维的分形特征进行特定的发射器识别

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Specific emitter identification (SEI) is a technique for distinguishing different emitters of a same type with other weak individual characteristics. Only using some traditional modulation parameters for recognition cannot distinguish different emitters with close modulation parameters. To solve the problem, new complex and high-dimensional features, which can characterize the emitters with more details, urgently need to be developed for recognition. An SEI method using fractal features based on box-counting dimension and variance dimension is presented. This paper mainly focuses on the weak individual characteristics caused by phase noise, applies fractal theory to the feature extraction, and finally establishes the recognition process using support vector machine. Numerical results show that the identification rate is generally more than 95% above 15dB of signal to noise ratio (SNR), and the real data experiment proves the practical performance of the proposed algorithm.
机译:特定发射器标识(SEI)是一种用于区分具有其他弱个体特征的相同类型的不同发射器的技术。仅使用一些传统的调制参数进行识别不能区分具有紧密调制参数的不同发射器。为了解决该问题,迫切需要开发新的复杂的高维特征,以更详细地描述发射器的特征。提出了一种基于分盒维数和方差维数的分形特征SEI方法。本文主要针对相位噪声引起的弱个体特征,将分形理论应用于特征提取,最后利用支持向量机建立识别过程。数值结果表明,在15dB的信噪比(SNR)之上,识别率通常大于95%,实际数据实验证明了该算法的实用性。

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