A galvanic isolated voltage probe for noise sources identification in EMI / EMC applications

摘要

In order to quickly identify the noise sources in power electronics converters for EMI/EMC applications, a galvanic isolated voltage probe is developed and optimized to achieve adequate measurement bandwidth and high common-mode rejection ratio (CMRR). Several structures of the voltage probes are proposed. The prototypes are built and the performances are evaluated through testing. The experimental result shows that the developed isolated voltage probe has an adequate measurement bandwidth up to 300MHz and CMRR is more than 40dB for the measurement frequency range.