首页> 外文会议>IEEE Radio Frequency Integrated Circuits Symposium >A 195 GHz single-transistor fundamental VCO with 15.3 DC-to-RF efficiency, 4.5 mW output power, phase noise FoM of −197 dBc/Hz and 1.1 tuning range in a 55 nm SiGe process
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A 195 GHz single-transistor fundamental VCO with 15.3 DC-to-RF efficiency, 4.5 mW output power, phase noise FoM of −197 dBc/Hz and 1.1 tuning range in a 55 nm SiGe process

机译:195 GHz单晶体管基频VCO,具有15.3%的DC-RF效率,4.5 mW的输出功率,−197 dBc / Hz的相位噪声FoM和55 nm SiGe工艺中的1.1%调谐范围

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A novel approach to design efficient high-output-power fundamental oscillators close to the f of the employed process is presented. The idea is based on shaping and optimizing the maximally efficient power gain (G) of the circuit using a pair of internal/external feedback mechanisms. Solving a constrained optimization problem, an optimum pair of passive feedback network is designed to achieve the highest maximally efficient power gain in order to increase the output power and thence the DC-to-RF efficiency. A 195 GHz fundamental oscillator is designed in a 55 nm SiGe process (f ≃ 340 GHz), which achieves a significantly higher DC-to-RF efficiency (15.3%) among all reported oscillators working above f/3 of their active devices. The oscillator generates a peak power of 4.5 mW (6.5 dBm) with the best phase noise of -82.3 dBc/Hz and the best FoM of -197 dBc/Hz measured at 100 KHz offset frequency, which is the best phase noise and FoM among all CMOS/SiGe mm-Wave oscillators. The proposed optimization-based method takes into account PVT variations as well as modeling errors of all components in the design process to guarantee the functionality of the fabricated circuit.
机译:提出了一种新颖的方法来设计接近所采用过程f的高效高输出功率基本振荡器。该思想基于使用一对内部/外部反馈机制对电路的最大有效功率增益(G)进行整形和优化。为了解决约束优化问题,设计了一对最佳的无源反馈网络,以实现最高的最大有效功率增益,从而增加输出功率,进而提高DC-RF效率。在55 nm SiGe工艺(f≃340 GHz)中设计了195 GHz基本振荡器,在所有工作于其有源器件的f / 3以上的振荡器中,它实现了显着更高的DC-RF效率(15.3%)。振荡器产生的峰值功率为4.5 mW(6.5 dBm),最佳相位噪声为-82.3 dBc / Hz,最佳FoM为-197 dBc / Hz,在100 KHz偏移频率下测得,这是最佳的相位噪声和FoM。所有CMOS / SiGe毫米波振荡器。所提出的基于优化的方法在设计过程中考虑了PVT变化以及所有组件的建模误差,以保证所制造电路的功能。

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