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Study on the corrosion behavior of metallic copper in aqueous solutions of HN03 and HC1 and the corrosion inhibiting effects of N and S

机译:HN03和HCl水溶液中金属铜的腐蚀行为及N和S的缓蚀作用研究

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Metallic copper is used in microelectronics because of its superb electrical and thermal conductivity in form of bond wires, heat sinks or lead frames. In the production process these components are normally embedded into a polymer which is known not to be entirely free of water. This can lead to corrosion reactions and local changes in the pH value, especially if a potential is applied, and can ultimately lead to failure of the device. In this process, the effect of anions, e.g. Cr, NO_3~-, which are present from former production steps, is not fully researched. Therefore, this work centers on copper and its passivation in aqueous environments including chloride ions at neutral and acid pH value. Additionally, the environmentally friendly and therefore so-called 'green' inhibitor cysteine was tested in reference to inhibition efficiency and critical concentration in some of the tested solutions. The study was performed at room temperature (25 °C) and the inhibitor was tested in varying concentrations. Measurements were done using a three electrode set-up with copper metal as a working electrode, platinum as a counter electrode and silver chloride as a reference electrode. On this set-up three different kinds of measurement were conducted: (i) Potentionamic polarization measurement, (ii) linear polarization resistance (LPR) and (iii) electrochemical impedance spectroscopy (EIS). The potentiostatic polarization measurement was done from -200 mV vs ocp up to +200 mV vs. ocp. The LPR was measured with an amplitude of 10 mV and a scanning rate of 1 mV/s. The EIS was measured from 0.1 to 65 000 Hz with an amplitude of 10 mV. Furthermore, imaging techniques like optical microscopy and scanning electron microscopy (SEM) were performed to visualize the surface of metallic copper after immersion in the corrosive solution.
机译:金属铜之所以用于微电子领域,是因为其以键合线,散热器或引线框架的形式具有极佳的导电性和导热性。在生产过程中,通常将这些组分嵌入聚合物中,该聚合物并非完全不含水。这可能导致腐蚀反应和pH值的局部变化,尤其是在施加电势的情况下,并最终导致设备故障。在此过程中,阴离子的作用例如以前的生产步骤中存在的Cr NO_3〜-尚未得到充分研究。因此,这项工作的重点是铜及其在水环境中的钝化,包括在中性和酸性pH值下的氯离子。另外,参照某些测试溶液中的抑制效率和临界浓度,对环境友好型的因此所谓的“绿色”抑制剂半胱氨酸进行了测试。该研究在室温(25°C)下进行,并测试了不同浓度的抑制剂。使用三电极装置(铜金属作为工作电极,铂作为对电极,氯化银作为参比电极)进行测量。在此设置上,进行了三种不同类型的测量:(i)电位极化测量,(ii)线性极化电阻(LPR)和(iii)电化学阻抗谱(EIS)。恒电位极化测量是在-200 mV vs. ocp至+200 mV vs. ocp的范围内进行的。 LPR的测量幅度为10 mV,扫描速率为1 mV / s。 EIS的测量范围为0.1至65 000 Hz,幅度为10 mV。此外,还进行了像光学显微镜和扫描电子显微镜(SEM)这样的成像技术,以使金属铜浸入腐蚀性溶液后的表面可视化。

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