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A 4.3μW 28nm-CMOS pixel front-end with switched inverter-based comparator

机译:具有基于开关反相器的比较器的4.3μW28nm-CMOS像素前端

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The complete design and electrical characterization of a readout frontend for high luminosity pixel detectors is hereby presented. The design has been carried out in 28nm bulk-CMOS technology. The selected technology process shows significant advantages in terms of radiation hardness, faster/low-power digital signal processing and whole chip area reduction. Nonetheless, it is challenging in terms of operating point (0.9V supply voltage at 0.5V threshold voltage for standard process transistors), dynamic range, and large sensitivity to Process-Voltage-Temperature variations. The proposed integrated circuit includes the cascade of a low-noise preamplifier stage and a switched-capacitor inverter-based comparator. The overall system detects input charges up to 14fC and provides information about the amount of the charge with a Time-over-Threshold (ToT) technique. It features 4.3μW power consumption, 54dB Signal Noise Ratio and 0.02mm2 area occupancy. A ToT range of 180ns in 28nm bulk-CMOS represents a challenge for the future Time-to-Digital Converters (TDC) used in High-Energy-Physics readout systems. Analog front-end and TDC development anticipate a higher charge quantization resolution in the next physics experiments.
机译:因此,提出了用于高亮度像素检测器的读出前端的完整设计和电气特性。该设计已采用28nm体CMOS技术进行。所选技术工艺在辐射硬度,更快/低功耗的数字信号处理和减少整个芯片面积方面显示出显着优势。尽管如此,在工作点(标准过程晶体管的阈值电压为0.5V时为0.9V电源电压),动态范围以及对过程电压-温度变化的大灵敏度方面,它仍然具有挑战性。所提出的集成电路包括一个低噪声前置放大器级和一个基于开关电容器反相器的比较器的级联。整个系统可检测到高达14fC的输入电荷,并通过阈值时间(ToT)技术提供有关电荷量的信息。它具有4.3μW的功耗,54dB的信噪比和0.02mm2的面积占用。 28nm体CMOS的ToT范围为180ns,这对未来高能物理读出系统中使用的时间数字转换器(TDC)构成了挑战。模拟前端和TDC的发展预计在下一个物理实验中将具有更高的电荷量化分辨率。

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