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Energy band gap and phonon frequency in semiconductors are material constants?

机译:半导体中的能带隙和声子频率是材料常数吗?

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We report both Raman shift and photoluminescence (PL) in Ge as a function of carrier density instead of dopant concentration. The results show both the energy band gap (Eg) and zone-centered phonon frequency are dependent on free carrier density. In the low voltage device operation, it should be taken into consideration that material constants so far accepted are not really constant anymore.
机译:我们报告了锗的拉曼位移和光致发光(PL)与载流子密度而不是掺杂剂浓度的关系。结果表明,能带隙(Eg)和以区域为中心的声子频率均取决于自由载流子密度。在低压设备的操作中,应考虑到迄今为止公认的材料常数不再是真正的常数。

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