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Vacuum interrupters: pressure vs. age A Study of Vacuum Levels in 314 Service Age Vacuum Breakers

机译:真空中断器:压力与年龄在314个服务年龄真空断路器中的真空水平研究

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All vacuum interrupters (VIs) increase in internal pressure over time. [Authors' note: In this paper the modern term vacuum interrupter will be used in lieu of the now obsolete vacuum bottle.] The pressure increase may be due to small, long-path leaks from outside to inside, diffusion through the container materials and/or virtual leaks from materials within the internal volume. Ⅵ manufacturers design and test their vacuum interrupters for a minimum lifetime of twenty to thirty years. VIs may successfully operate beyond this period but it is beyond their design life. Since the first large influx of vacuum interruption in the early 1970s, the technology has become the most widely applied power interruption technique in the medium voltage range (2.4kV - 38kV). Vacuum technology now dominates the interrupter market throughout the world. This means that there are hundreds of thousands of VI breakers and contactors in field that were manufactured twenty or more years ago. Inevitably, in-service Ⅵ failures caused by vacuum loss have greatly increased over the last ten years. Until recently there was no technology that allowed field testing vacuum levels in VIs. Using a field portable magnetron, test technicians can now test vacuum level and thereby evaluate the Ⅵ condition based on that parameter. The vacuum level test is called the Magnetron Atmospheric Condition (MAC) test. To further knowledge in this area, the authors have performed vacuum level tests on 314 circuit breakers (809 VIs). The VIs being tested were installed in breakers that had manufacturing dates ranging from 1978 through 2014. It is assumed that the VIs were manufactured at the same time as the breakers. The results of these tests have been evaluated. This paper describes the data gathering methodology, shows the analysis that was done, and presents the results of that analysis.
机译:所有真空中断器(VI)随着时间的推移而增加内部压力。 [作者注:在本文中,现代术语真空中断器将被使用代替现在已经过时的真空瓶。]压力增加可能是由于外部到内部的小,长路径泄漏,通过集装箱材料扩散/或虚拟泄漏内部体积内的材料。 ⅵ制造商设计并测试其真空中断器,最低寿命二十至三十年。 VIS可能成功地在此期间超出,但它超出了他们的设计生活。由于第一大量涌入在70年代初期真空中断,该技术已成为中压范围中的最广泛应用的电源中断技术(2.4kV - 38kV)。真空技术现在占据了全世界的断路器市场。这意味着在二十多年前制造的现场有数十万个VI断路器和接触器。不可避免地,在过去十年中,真空损失引起的失败在过去十年中大大增加。直到最近,没有技术可以在VI中允许现场测试真空水平。使用现场便携式磁控管,测试技术人员现在可以测试真空级别,从而根据该参数评估ⅵ条件。真空水平试验称为磁控常量条件(MAC)测试。为了进一步了解这一领域,作者在314断路器(809 VI)上进行了真空水平测试。正在测试的VI被安装在具有1978年至2014年的制造日期的破碎机中。假设VIS在断路器同时制造。已经评估了这些测试的结果。本文介绍了数据收集方法,显示了完成的分析,并提出了该分析的结果。

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