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On the implication of the grain boundary character on hydrogen diffusion and trapping in the nickel bicrystals

机译:晶界特征对镍双晶中氢扩散和俘获的影响

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Hydrogen Embrittlement (HE) is one of the causes mainly evoked in premature rupture of industrial components exposed to aggressive environment. Many studies have been conducted in order to understand the mechanisms involved during this degradation. However the effects of the grain boundaries (GBs), triple junction (TJs) and several defects (dislocations, vacancies ...) in FCC materials and their interactions with hydrogen on the mechanisms of metal damages remain controversy. In fact, several works suggest that in FCC materials the grain boundaries represent preferential paths for hydrogen (short-circuit diffusion), and that hydrogen diffusion along GBs is higher than interstitial diffusion. However, GBs contain different defects, particularly, dislocations and vacancies. These defects are able to trap hydrogen affecting the diffusion mechanisms. The density and configuration of these defects are accommodated by the character of grain boundaries. Indeed, we distinguish different GBs classes. GBs with small misorientation (LAGB) that are accommodated by one dislocation network, and GBs with large misorientation (HAGB), which can be defined or not by coincidence site lattice network (CSL). In this study, we have several bicrystals of pure nickel with different grain boundary classes (according to misorientation and CSL index). For each bicrystal (grain boundary), we evaluated the hydrogen diffusion and trapping mechanisms using the electrochemical permeation (EP) coupled to the thermal desorption spectroscopy (TDS). The results will allow us to associate the short-circuit diffusion and trapping phenomena to the grain boundaries character.
机译:氢脆(HE)是引起暴露于腐蚀性环境中的工业组件过早破裂的主要原因之一。为了理解降解过程中涉及的机制,已经进行了许多研究。然而,FCC材料中晶界(GBs),三重结(TJs)和一些缺陷(位错,空位……)的影响以及它们与氢的相互作用对金属损伤的机理仍存在争议。实际上,有几项研究表明,在FCC材料中,晶界代表了氢的优先路径(短路扩散),并且沿GBs的氢扩散高于间隙扩散。但是,GB包含不同的缺陷,特别是位错和空位。这些缺陷能够捕获影响扩散机理的氢。这些缺陷的密度和构型由晶界的特征来适应。实际上,我们区分了不同的GBs类。一个位错网络可以容纳的具有较小方向错误的GB(LAGB),以及可以由重合站点网格网络(CSL)定义或没有定义的具有较大方向错误的GB(HAGB)。在这项研究中,我们有几种具有不同晶界类别(根据取向和CSL指数)的纯镍双晶。对于每个双晶(晶界),我们使用与热脱附光谱法(TDS)耦合的电化学渗透(EP)评估了氢的扩散和捕集机制。结果将使我们将短路扩散和俘获现象与晶界特征联系起来。

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