Wave-inspired Corrections for an Efficient Ray-optical Description of Micro-optics Devices

摘要

Ray optics is a versatile tool to describe microscale optical systems like microlasers and their far-field emission. It is successful even in the regime where a wave-dynamical description would be expected to be appropriate. Indeed, when considering structures at length scales of a few light wavelengths, wave-inspired adjustments have to be taken into account to ensure the accuracy of ray-based predictions. These corrections to ray optics are known as the Goos-Hanchen shift, a lateral shift along the interface, and the Fresnel filtering effect, an angular shift, violating Snells law and the principle of ray-path reversibility. In this contribution, we study in detail the influences of different factors on the exact size of the corrections paying special attention to the interplay between beam parameters and interface geometry. We obtain our results from analytical calculations using an expectation value approach to the beam shifts. These findings are supported by FDTD simulations. Knowing the influences of the different parameters, we are able to incorporate well adjusted correction terms in the ray-optical calculations for a large class of micro-optics devices with curved and planar boundaries.