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Probe based antenna measurements up to 325 GHz for upcoming millimeter-wave applications

机译:基于探针的天线测量高达325 GHz,用于即将到来的毫米波应用

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In this paper a probe based measurement setup is presented that allows the characterization of antennas in the frequency-range between 220 GHz and 325 GHz. The radiation pattern, as well as the gain and the return loss of the antenna under test (AUT) can be measured. The limits of the system in terms of accuracy and dynamic range are given. To demonstrate its functionality a 240 GHz patch-antenna on Gallium Arsenide (GaAs) substrate is measured. A comparison between simulation and measurement shows very good agreement.
机译:在本文中,提出了一种基于探测的测量设置,其允许在220GHz和325GHz之间的频率范围内表征天线。 可以测量辐射图案,以及下的天线(AUT)的增益和返回丢失。 给出了在精度和动态范围方面的系统的极限。 为了展示其功能,测量砷化镓(GaAs)基板上的240GHz斑点天线。 仿真和测量之间的比较显示了非常好的协议。

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