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Testing single phase IGBT H-bridge switch plates for the high voltage converter modulator at the Spallation Neutron Source

机译:在Spallation中子源上测试用于高压转换器调制器的单相IGBT H桥开关板

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Three IGBT H-bridge switching networks are used in each High Voltage Converter Modulator (HVCM) system at the Spallation Neutron Source (SNS) to generate drive currents to three boost transformer primaries switching between positive and negative bus voltages at 20 kHz. Every switch plate assembly is tested before installing it into an operational HVCM. A Single Phase Test Stand has been built for this purpose, and it is used for adjustment, measurement and testing of different configurations of switch plates. This paper will present a description of the Test Stand configuration and discuss the results of testing switch plates with two different types of IGBT gate drivers currently in use on the HVCM systems. Comparison of timing characteristics of the original and new drivers and the resulting performance reinforces the necessity to replace the original H-bridge network drivers with the upgraded units.
机译:在散裂中子源(SNS)的每个高压转换器调制器(HVCM)系统中使用三个IGBT H桥开关网络,以产生驱动电流到三个升压变压器初级线圈,在20 kHz的正负总线电压之间切换。在将每个开关板组件安装到可操作的HVCM中之前,均应进行测试。为此目的,已经建造了一个单相测试台,它用于调节,测量和测试开关板的不同配置。本文将介绍测试台配置,并讨论使用HVCM系统上当前使用的两种不同类型IGBT栅极驱动器测试开关板的结果。比较原始驱动程序和新驱动程序的时序特性以及由此产生的性能,强调了用升级后的单元替换原始H桥网络驱动程序的必要性。

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