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Nano-displacement measurements of a new piezoelectric flextensional actuator by using a high dynamic range interferometry homodyne method

机译:高动态范围干涉法零差法测量新型压电弯曲执行器的纳米位移

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Piezoelectric flextensional actuator (PFA) devices consist in a technology in development, with increasing number of applications in precision mechanics such as nanotechnology equipments, electronic microscopy instruments, cell manipulation systems, microsurgery tools, and lens positioner for laser interferometer to name a few. In turn, optical interferometry is an adequate technique to measure nano/ micro displacements and to characterize these PFAs. An efficient method for optical phase detection is the n-commuted Pernick method (n-CPM), where only a limited number of frequencies in the magnitude spectrum of the photo detected signal are used, without the need to know the phase spectrum. The n-CPM has the advantages of being passive homodyne, direct, self-consistent, and is immune to fading. The dynamic range for optical phase measurements is from 0.2 rad to 100π rad. In this work, by using the n-CPM, a new PFA prototype designed by topology-optimization method is tested in terms of displacement linearity (relative to applied voltage) and frequency response.
机译:压电弯曲致动器(PFA)设备属于一项正在开发的技术,在诸如纳米技术设备,电子显微镜仪器,细胞操纵系统,显微外科手术工具以及激光干涉仪的透镜定位器等精密机械中的应用越来越多。反过来,光学干涉测量法是测量纳米/微位移并表征这些PFA的适当技术。用于光学相位检测的有效方法是n换向Pernick方法(n-CPM),其中仅使用光检测信号幅度谱中的有限数量的频率,而无需知道相位谱。 n-CPM具有被动零差,直接,自洽且不易褪色的优点。光学相位测量的动态范围为0.2 rad至100πrad。在这项工作中,通过使用n-CPM,以位移线性度(相对于施加电压)和频率响应的方式测试了通过拓扑优化方法设计的新PFA原型。

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