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A simply instrument for measuring the linear birefringence changes and the phase retardation in electro-optic crystals

机译:测量电光晶体中线性双折射变化和相位延迟的简单仪器

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We propose a new method to measure the birefringence changes in bulk crystals based on the typical Senarmont configuration. The configuration comprises a linear polarizer, a sample, a quarter-wave plate, an analyzer(P.S.C.A). An external modulator is inserted in the experimental Senarmont setup. We present a complete analysis of the optical response of a Senarmont setup within Jones formulation. Compared to the conventional configurations. The new method is able to measure with a high accuracy the variations of the birefringence in any crystal.
机译:我们提出了一种基于典型的Senarmont配置来测量块状晶体中双折射变化的新方法。该配置包括线性偏振器,样品,四分之一波片,分析仪(P.S.C.A)。在实验的Senarmont设置中插入了一个外部调制器。我们对Jones配方中的Senarmont装置的光学响应进行了完整的分析。与常规配置相比。新方法能够高精度地测量任何晶体中双折射的变化。

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