Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer

摘要

This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.