Laboratory Bench for Predicting the Reliability of Wireless Devices Based on the NI MyRIO Platform

摘要

The report discusses the use of National Instruments tools for dependability prediction of electronic devices by simulation modeling. The description of the laboratory bench allowing to develop formal models based on reliability block diagrams, to carry out simulation experiment and to process statistical modeling results, is given as well as an example of this bench usage for reliability prediction of power supply of the lightweight spacecraft.