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Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated

机译:碳纳米管不完美免疫数字VLSI:常见提问更新

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摘要

Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for designing highly energy-efficient future digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections that pose major obstacles to robust CNFET digital VLSI. This paper summarizes commonly raised questions and concerns about CNFET technology through a series of frequently asked questions. The specific questions addressed in this paper are motivated by recent advances in the field since the publication of our earlier paper on frequently asked questions in the Proceedings of the 2009 Design Automation Conference.
机译:碳纳米管场效应晶体管(CNFET)是用于设计高度节能未来数字系统的优异候选者。然而,碳纳米管(CNT)本质上高度受到缺陷的缺陷,使得鲁棒CNFET数字VLSI构成主要障碍。本文通过一系列常见问题概述了对CNFET技术的常见问题和担忧。本文所涉及的具体问题是本领域最近进展的动机,自2009年设计自动化会议的常见问题上的常见问题出版物。

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