Automated Multi-Channel DC-Biased Burn-in Test System using Hall Effect Current Sensor

摘要

This manuscript reports on a fast, accurate, and cost-effective current sensing technique for multi-channel DC-biased burn-in test systems. Hybrid microwave modules designed for military and space platforms must be undergone electrical burn-in and life tests according to the production-level military and space qualification standards. These tests require prolonged test durations on the order of hundreds of hours and multi-channel test setups along with the continuous current monitoring and recording for each device under test (DUT). Current monitoring for a single channel setup is quite straightforward. However, for multi-channel test scenario, using the conventional test methods with specific power supply for each DUT may lead to costly and bulky systems. Precision Hall-effect current sensor is a good alternative monitoring the current of DUTs using a common power supply. For such a current sensor, as the current flows through the copper conduction path, it creates a magnetic field that is sensed by the integrated Hall integrated circuit (IC) and converted into a linearly proportional voltage. To digitize the output voltage of the sensor, a precision analog-to-digital converter (ADC) with SPI or I2C communication interface is used. One advantage of using the Hall sensor structure for measuring the target current will result in minimal power loss due to the non-contact inductive detection. In addition to the utilization of Hall-effect current sensor, we implemented single-pole-single-throw (SPST) switch and fast acting fuse for each DUT line in order to protect the system, in case of an early failure in the DUTs. As a result, using the abovementioned configuration we conducted DC burn-in and life tests on various radio frequency (RF) and microwave (MW) high power hybrid modules.