Accelerated reliability growth test under multiple environment stresses

摘要

Single-stress accelerated reliability growth test is restricted as the limited improvement of a stress. In order to further shorten the lead time of a product, on the basis of the single-stress accelerated reliability growth test, we developed a double-stress accelerated reliability growth model based on AMSAA-BISE growth model and generalized Egring accelerated model. We presented the test program design based on the uniform theory. Then propose parameter estimation method respectively based on the maximum likelihood estimation for reliability growth model and the least squares estimation for the accelerated life model. Finally, specific example is given to verify the correctness of the model. Through comparison of the estimated and simulated value of the life character, it can be concluded that the multiple-stress accelerated reliability growth model proposed in this paper is correct and feasible.