A Low-complexity GSM Baseband Detector for RF BIST

摘要

We present a low-complexity digital baseband detector for GSM applications for functional RF BIST of the receiver section of a complex transceiver SoC implemented in 90-nm digital CMOS process. The detector can be used as a pass/fail criterion during factory testing using a Tx-Rx RF loopback mode or with an inexpensive signal generator. It can also be used for testing of the analog and digital base-band data paths of the receiver without requiring any external equipment. The detector is implemented as part of a quad-band GSM/GPRS transceiver SoC implemented in 90-nm digital CMOS process and it occupies 0.05mm{sup}2. In a special configuration of the receiver, the detector also supports a fully functional Bluetooth mode.