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Optimization of a voltage sense amplifier operating in ultra wide voltage range with back bias design techniques in 28nm UTBB FD-SOI technology

机译:利用28nm UTBB FD-SOI技术中的反向偏置设计技术,优化了在超宽电压范围内工作的电压检测放大器

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Advanced SoC designs regularly use Dynamic Voltage and Frequency Scaling (DVFS) to achieve high performance and low power targets of portable systems. In this paper, we focus on optimization of a Voltage Sense Amplifier (VSA) in 28nm Ultra-Thin Body and BOX Fully Depleted SOI (UTBB FD-SOI) technology to achieve high performance operations over the Ultra Wide Voltage Range (UWVR) from 1.3V to 0.4V. We use Flip-Well design methodology along with forward body bias modulation to extend operation range of the VSA and also reduce sense amplifier read time by 28%, while saving power consumption by up to 59% compared to Bulk technology.
机译:先进的SoC设计通常使用动态电压和频率缩放(DVFS)来实现便携式系统的高性能和低功耗目标。在本文中,我们专注于优化28nm超薄机身中的电压检测放大器(VSA)和BOX全耗尽SOI(UTBB FD-SOI)技术,以实现从1.3的超宽电压范围(UWVR)的高性能操作V至0.4V。与批量技术相比,我们将Flip-Well设计方法与正向主体偏置调制一起使用,以扩大VSA的工作范围,并将感测放大器的读取时间减少28%,同时节省多达59%的功耗。

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