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Model-based validation and development of LED-systems: MValEnt

机译:LED系统基于模型的验证和开发:MValEnt

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Durability of LEDs is usually specified to 10,000 hours though numerous LED products feature a lesser operation life. This might be caused by faulty constructions or improper physical environments and operating conditions. Since such failure cannot be accepted for cost intensive applications in automotive, medical or illuminating engineering simulation based prediction of LEDs durability is a promising design approach. Main causes of degradation are manufacturing and operation temperatures or temperature gradients, respectively. These result in an increased diffusion, accelerated chemical reactions and induced material stresses. In a consequence, chemical, physical and mechanical properties of parts are altered. To investigate conditions of LED operation, LEDs degradation and conditions of failure a test environment considering electrical and thermal loads as well as optical emission has been designed. Furthermore, the LED test environment has been modelled within the software application MatLAB/Simulink to simulate and predict the durability of complex LED-systems. Test environment, computer-aided simulation and a test design using design of experiments are combined to a design tool named MValEnt. This supports validation and design of complex LED-systems for varied conditions of operations and component characteristics. Integrated data interfaces provide an iterative product development. Load measurements reveal different failure mechanisms due to characteristics of operating current, ambient temperature and pulse-width modulation (pwm) as well as operation interruptions. Electrical and thermal coupling of LED circuits results in additional loads and thus degradation. With increasing power mechanisms of LEDs degradation are comparable to those found in power electronics.
机译:尽管许多LED产品的使用寿命较短,但通常将它们的使用寿命指定为10,000小时。这可能是由于结构错误或物理环境和操作条件不当引起的。由于这种故障对于汽车,医学或照明工程仿真中的高成本应用无法接受,因此基于LED耐久性的预测是一种有前途的设计方法。退化的主要原因分别是制造和操作温度或温度梯度。这些导致增加的扩散,加速的化学反应和诱发的材料应力。结果,零件的化学,物理和机械性能被改变。为了研究LED的运行状况,LED的退化和故障状况,设计了一个考虑电气和热负荷以及光发射的测试环境。此外,已经在软件应用程序MatLAB / Simulink中对LED测试环境进行了建模,以模拟和预测复杂LED系统的耐久性。测试环境,计算机辅助仿真和使用实验设计的测试设计被组合到名为MValEnt的设计工具中。这支持复杂LED系统的验证和设计,以适应不同的操作条件和组件特性。集成的数据接口提供了迭代的产品开发。由于工作电流,环境温度和脉冲宽度调制(pwm)的特性以及工作中断,负载测量揭示了不同的故障机理。 LED电路的电和热耦合会导致额外的负载,从而导致性能下降。随着功率器件的增加,LED的退化与功率电子器件中的退化相当。

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