Simulation of LF noises FET in the program #x00AB;Micro-Cap#x00BB; in THE #x00AB;Transient analysis#x00BB; mode

机译：在“瞬态分析”模式下的“微型电容”程序中模拟LF噪声FET

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The model of the modulation LF noise source which allows to simulate noise in the «Micro-Cap» program in the «Transient analysis» mode is given. Results of simulation of the flicker noise of FET are shown, when using this noise source.

机译：给出了调制LF噪声源的模型，该模型允许在“瞬态分析”模式下的“微型电容”程序中模拟噪声。使用此噪声源时，显示了FET闪烁噪声的仿真结果。

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《International Conference on Actual Problems of Electron Devices Engineering》|2012年|p.46-50|共5页
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Malyshev V.M.;
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中图分类电子元件、组件;电子元件、组件;
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Simulation of LF noises FET in the program #x00AB;Micro-Cap#x00BB; in THE #x00AB;Transient analysis#x00BB; mode

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