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The low Earth orbit radiation environment and its impact on the prompt background of hard x-ray focusing telescopes

机译:低地球轨道辐射环境及其对硬X射线聚焦望远镜即时背景的影响

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The background minimization is a science-driven necessity in order to reach deep sensitivity levels in the hardX-ray band, one of the key scientific requirements for hard X-ray telescopes (e.g. NuSTAR, ASTRO-H). Itrequires a careful modeling of the radiation environment and new concepts of shielding systems. We exploitthe Bologna Geant4 Multi-Mission Simulator (BoGEMMS) features to evaluate the impact of the Low EarthOrbit (LEO) radiation environment on the prompt background level for a hybrid Si/CdTe soft and hard X-raydetection assembly and a combined active and passive shielding system. For each class of particles, the spectraldistribution of the background flux is simulated, exploring the effect of different materials (plastic vs inorganicactive scintillator) and configurations (passive absorbers enclosing or surrounded by the active shielding) onthe background count rate. While protons are efficiently removed by the active shielding, an external passiveshielding causes the albedo electrons and positrons to be the primary source of background. Albedo neutronsare instead weakly interactive with the active shielding, and they cause an intense background level below 10keV via elastic scattering. The best shielding configuration in terms of background and active shielding countrates is given by an inorganic scintillator placed inside the passive layers, with the addition of passive materialto absorb the intense fluorescence lines of the active shielding and avoid escape peaks on the CdTe detector.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:最小化背景是科学驱动的必要条件,以便在硬X射线波段(例如,NuSTAR,ASTRO-H)的关键科学要求之一即硬X射线波段中达到较高的灵敏度水平。它要求对辐射环境和屏蔽系统的新概念进行仔细的建模。我们利用Bologna Geant4多任务模拟器(BoGEMMS)功能来评估低地球轨道(LEO)辐射环境对混合Si / CdTe软硬X射线检测组件以及主动和被动屏蔽组合的即时背景水平的影响系统。对于每类粒子,模拟了背景通量的光谱分布,探索了不同材料(塑料与无机活性闪烁体)和配置(无源吸收体包围或被有源屏蔽包围)对背景计数率的影响。尽管通过主动屏蔽可以有效地除去质子,但外部被动屏蔽会使反照率电子和正电子成为背景的主要来源。反照率中子与主动屏蔽层之间的相互作用较弱,它们通过弹性散射引起低于10keV的强烈背景能级。就本底和有源屏蔽计数率而言,最佳屏蔽配置是由放置在无源层内部的无机闪烁体提供的,并添加无源材料以吸收有源屏蔽的强烈荧光线并避免CdTe检测器上的逸散峰。©( 2012)COPYRIGHT光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

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