ATPG for Reversible Circuits Using Simulation, Boolean Satisfiability, and Pseudo Boolean Optimization

摘要

Research in the domain of reversible circuits found significant interest in the last years - not least because of the promising applications e.g. in quantum computation and low-power design. First physical realizations are already available, motivating the development of efficient testing methods for this kind of circuits. In this paper, complementary approaches for automatic test pattern generation for reversible circuits are introduced and evaluated. Besides a simulation-based technique, methods based on Boolean satisfiability and pseudo-Boolean optimization are thereby applied. Experiments on large reversible circuits show the suitability of the proposed approaches with respect to different application scenarios and test goals, respectively.