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Analysis of SF6 decomposition products by insulator flashover to detect the insulator condition

机译:通过绝缘子闪络分析SF 6 分解产物以检测绝缘子状况

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An evident fault occurs on the insulator surface accompanied by a remarkable insulator strength decline were detected, which is probably caused by the SF6 decomposition products in the insulator flashover process. A simulation of flashover process on the insulator surface was built in this article in order to analyze the possible decomposition product of SF6. As a result, several specific decomposition products (eg. CS2) of the primary insulator material were discovered, which make it possible to assume the reaction mechanism and further application of insulator flashover process via analysis of specific gas such as CS2.
机译:在绝缘子表面上发生明显的故障,伴随着显着的绝缘体强度下降,检测到绝缘体闪络过程中的SF 6 分解产品。在本文中建立了绝缘体表面上的闪络过程的模拟,以分析SF6可能的分解产物。结果,发现了初级绝缘体材料的几种特定的分解产物(例如,CS 2 ),这使得可以通过特定气体分析来假设反应机理和进一步应用绝缘体闪络过程如CS 2

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