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Design of a Printed Antenna Array for Cost-effective ATE to Reduce the Radiated EMI Yield Loss

机译:具有成本效益的ATE的印刷天线阵列设计,可降低辐射的EMI产量损失

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This work proposes a printed antenna array for cost-effective ATE test approach to decrease RF testing yield loss. Background noise of the system-under-test is surveyed based on a prototype load-board equipped with the proposed printed antenna system to analyze the correlation between the test data and background noise in order to identify the root causes of yield loss. Theoretical analysis based on the Monte-Carlo procedure validates the proposed cost-effective ATE design approach. Experimental results of RF testing in the EMI environment correlate well with a low yield mass production scenario that is estimated to address the EMI issue.
机译:这项工作提出了一种用于成本有效的ATE测试方法的印刷天线阵列,以减少RF测试的良率损失。基于配备有拟议的印刷天线系统的原型负载板,对被测系统的背景噪声进行了调查,以分析测试数据与背景噪声之间的相关性,从而确定产量损失的根本原因。基于蒙特卡洛程序的理论分析验证了所提出的具有成本效益的ATE设计方法。在EMI环境中进行RF测试的实验结果与低产量的大规模生产场景密切相关,据估计,该场景可解决EMI问题。

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