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Use of the Abbe Sine Condition to Quantify Alignment Aberrations in Optical Imaging Systems

机译:使用阿贝正弦条件来量化光学成像系统中的对准像差

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Violation of Abbe's sine condition is well-known to cause coma in axisymmetric imaging systems, and generally any offense against the sine condition (OSC) will cause aberrations that have linear dependence on the field angle. A well-corrected imaging system must obey the Abbe sine condition. A misaligned optical system can have particular forms of the OSC which are evaluated here. The lowest order non-trivial effects of misalignment have quadratic pupil dependence which causes a combination of astigmatism and focus that have linear field dependence. Higher order terms can arise from complex systems, but the effects of misalignment are nearly always dominated by the lowest order effects which can be fully characterized by measuring images on axis and the on-axis offense against the sine condition. By understanding the form of the on-axis images and the OSC, the state of alignment can be determined.
机译:违反ABBE的正弦状况令人熟悉的是在轴对称成像系统中引起昏迷,并且通常对正弦状况(OSC)的任何冒犯都会导致对场角具有线性依赖的像差。良好的成像系统必须遵守ABBE正弦状况。未对准的光学系统可以具有在此评估的特定形式的OSC。未对准的最低阶非琐碎效果具有二次瞳孔依赖,导致具有线性场依赖性的散光和焦点的组合。从复杂的系统出现高阶术语,但未对准的影响几乎始终由最低阶效应主导,这可以通过测量轴上的图像和针对正弦状况的轴上的图像来完全表征。通过理解轴上图像和OSC的形式,可以确定对准状态。

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