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Control and measurement system for high quality superconducting cavities

机译:高质量超导腔的控制和测量系统

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The measurements of superconducting cavity parameters before module assembly stage are very important, because they allow to evaluate critical properties (resonant frequency, quality factor of accelerating mods) of individual resonating cavities. Such measurements are performed in Vertical Test Stand facilities. One of such setups is Vertical Test Stand II (VTS II) at DESY. It is used for conditioning and characterization of cavities for FEL (Free Electron Laser) experiments (especially for FLASH and European XFEL). In the previous set-up cavities in VTS II were operated in Continuous Wave mode using analog control system. The core of the system was analog Phase Lock Loop used to lock phases of incident wave and transmitted wave. All measurements were done using external equipment such as oscilloscopes, spectrum network analyzers, etc. The main disadvantage of such system was lack of flexibility - each small modification required precise system tuning, no new functionality could be added and automation of measurements was hard to achieve. The paper presents new solution of the control system for VTS II based on digital hardware. It allows to overcome most of disadvantages of previous analog system. All measurements and control functions are integrated on a single (FPGA based) computation board, which is fully integrated with external control system. The usage of such system offers functionality such as long term data acquisition (due to Continuous Wave operation of the cavity), special modes of operation (like Self Excited Loop or Digital PLL - due to low bandwidth of measured resonator) and possibility of measurement process automation. Additionally developed user interfaces allow remote access to the system parameters and flexible configuration. The paper discusses each sub-system, presents measurement results and overall system performance evaluation together with some views for future functionality development.
机译:在模块组装阶段之前,对超导腔参数的测量非常重要,因为它们可以评估各个谐振腔的关键特性(谐振频率,加速模的品质因数)。此类测量在垂直测试台设备中进行。这样的设置之一是DESY的Vertical Test Stand II(VTS II)。它用于FEL(自由电子激光)实验(尤其是FLASH和European XFEL)的腔体调节和表​​征。在以前的设置中,VTS II中的型腔使用模拟控制系统以连续波模式进行操作。该系统的核心是模拟锁相环,用于锁定入射波和透射波的相位。所有测量都是使用示波器,频谱网络分析仪等外部设备完成的。这种系统的主要缺点是缺乏灵活性-每个小的修改都需要精确的系统调整,无法添加新功能,并且难以实现测量的自动化。本文提出了一种基于数字硬件的VTS II控制系统的新解决方案。它可以克服以前的模拟系统的大多数缺点。所有测量和控制功能都集成在单个(基于FPGA)计算板上,该计算板与外部控制系统完全集成。这种系统的使用提供了诸如长期数据采集(由于腔体的连续波操作),特殊的操作模式(如自激环路或数字PLL-由于被测谐振器的带宽低)和功能性等功能的功能自动化。另外开发的用户界面允许远程访问系统参数和灵活的配置。本文讨论了每个子系统,介绍了测量结果和整体系统性能评估,以及对将来功能开发的一些看法。

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