首页> 外文会议>International Conference on Actual Problems of Electron Devices Engineering >A Testing Device for Thin Film Electroluminescent Indicators
【24h】

A Testing Device for Thin Film Electroluminescent Indicators

机译:薄膜电致发光指标的测试装置

获取原文

摘要

Elements of a display are an important part of information systems. Necessary to study parameters of materials and designs. To create new samples of indicators and control the quality. This problem required an integrated approach. Therefore the development of an automated device for testing thin film electroluminescent indicators is an important task as it allows accelerating the search for new materials and structures with necessary parameters. Investigators of Ulyanovsk State Technical University together with scientists from Ulyanovsk State Civil Aviation University investigated the algorithms, methods and devices for measuring parameters of thin film electroluminescent indicators. As a result of the project of the automated device for testing thin film electroluminescent indicators was developed.
机译:显示器的元素是信息系统的重要组成部分。学习材料和设计参数所必需的。创建新的指标样本并控制质量。这个问题需要一个综合方法。因此,用于测试薄膜电致发光指标的自动化装置是一个重要任务,因为它允许通过必要的参数加速搜索新材料和结构的重要任务。 Ulyanovsk州技术大学的调查员与来自Ulyanovsk州的科学家们民航大学调查了测量薄膜电致发光指标参数的算法,方法和装置。由于开发了用于测试薄膜电致发光指标的自动化装置的项目。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号