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On the speckle pattern interferometry analysis of instrument errors

机译:散斑图样干涉仪分析仪器误差

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Photoelectron interference speckle class precision equipment by many factors, often below standard detection accuracy This paper will mainly measurement error are discussed. Summarizes the error detection system consists of two parts, namely, system error and random error. In this paper the causes that produce these errors were analyzed, Clearly the accuracy of the detection system and a number of parameters. More accurately calculate the size of the various error, clear all errors on the measurement of the degree Proposed to reduce and eliminate these errors specific measures. This type of equipment to improve manufacturing precision, and the proper use of such equipment with some guidance.
机译:光电子干扰散斑类精密设备受很多因素的影响,经常会低于标准检测精度。本文将主要对测量误差进行讨论。总结误差检测系统由两部分组成,即系统误差和随机误差。在本文中,分析了产生这些错误的原因。显然,检测系统的准确性和许多参数。更准确地计算出各种误差的大小,清除所有误差对测量的程度,建议减少和消除这些误差的具体措施。这种类型的设备可以提高制造精度,并对此类设备的正确使用具有一定的指导意义。

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