Dynamic reliability analysis of high-rise buildings under stochastic near-fault impulsive ground motions

摘要

A dynamic reliability analysis method for high-rise buildinginvolving the P-Delta effect under stochastic near-fault impulsiveground motions is presented. The EVD-based method alleviatesthe overall numerical efforts by reducing the number ofevaluations of the limit state function which is implicit withrespect to time significantly for nonlinear reliability analysis. Theefficiency and accuracy of the proposed method are validated bya numerical study. In addition, the results show that the reliabilityis overestimated significantly when the P-Delta effect isneglected under stochastic near-fault impulsive ground motions.