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Recollections of MCT Work in the UK at Malvern and Southampton

机译:英国在马尔文和南安普敦的MCT工作回顾

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MCT was discovered in the UK in 1958. This paper reviews key developments in the research and development of the material and devices from the early days to the present. The growth of the material by Bridgman, LPE and MOVPE methods is described. Fabrication techniques are described for SPRITES, two dimensional and long linear "loophole" diode arrays and the more recent wafer scale technologies for very large arrays. The use of multilayer heterostructures in Auger-suppressed diodes, two-colour detectors and negative luminescence devices is outlined. A brief glimpse of the future potential for the growth of MCT directly onto silicon circuits is given.
机译:MCT于1958年在英国发现。本文回顾了从早期到现在的材料和设备研究与开发的主要进展。描述了通过Bridgman,LPE和MOVPE方法进行的材料生长。描述了用于SPRITES,二维和长线性“漏洞”二极管阵列的制造技术,以及用于超大型阵列的最新晶圆级技术。概述了在俄歇抑制二极管,双色检测器和负发光器件中多层异质结构的使用。简要概述了MCT直接在硅电路上生长的未来潜力。

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