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The Influence of Polarization Direction on the Visibility of the New Fourier-Transform Spectrometer based on Wollaston Prisms

机译:偏振方向对基于Wollaston Prisms的新型傅立叶变换光谱仪的可见性的影响

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Fourier transform spectroscopy has evolved over several decades into an analytic spectroscopic method which application throughout the physical, chemical, and biological sciences. The conventional Fourier transform spectrometer (FTS) is based on a scanning Michelson interferometer. To overcome the limitations induced by mechanical scanning device in the Michelson interferometer, there are several types of FTS with non-scanning system were presented. One of them utilizes the polarization element such as Wollaston prism or Savart plate. In this paper the principle of a new FTS based on a Wollaston prism array is presented. Compared with the conventional polarization FTS, it has higher spectral resolution and optical throughput. There are many factors have influence on the fringe visibility of FTS. Here we focus on discussing the influence of the fringe visibility affected by the direction of the polarization elements in this FTS. The fringe visibility of the interferogram is the function which variables are the small angles departure of the theory polarization direction α,β. When the value of the fringe visibility is given, the values of angle α,β, are obtained. This is helpful to the alignment of the polarizing elements during the construction of polarization interferometer. The spectrum which uses the He-Ne laser as the optical source is acquired and recovered through the Fourier-transform program. At present time the spectral resolution of this system is 4 nm.
机译:傅里叶变换光谱已经在几十年中进化到了整个物理,化学和生物科学的分析光谱法。传统的傅里叶变换光谱仪(FTS)基于扫描迈克尔逊干涉仪。为了克服Michelson干涉仪中的机械扫描装置引起的限制,呈现了几种类型的FTS,呈现了非扫描系统。其中一个利用诸如Wollaston Prism或Savart板的偏振元件。本文提出了一种基于Wollaston Prism阵列的新FT的原理。与传统的偏振FT相比,它具有更高的光谱分辨率和光吞吐量。有许多因素对FTS的边缘可见性有影响。在这里,我们专注于讨论受该FTS中偏振元件方向影响的边缘可见性的影响。干涉图的条纹可见性是变量是理论偏振方向α,β的小角度偏离的函数。当给出条纹可见度的值时,获得角度α,β的值。这有助于在偏振干涉仪的构造期间对准偏振元件的对准。通过傅立叶变换程序获取和恢复使用HE-NE激光作为光源的光谱。目前该系统的光谱分辨率为4nm。

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