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Micro force Measurement by an Optical Method

机译:光学法测微力

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We discuss the application of stress-induced changes in the crystal of a monolithic Nd: YAG laser as a possibility for micro force measurement. In fact, the application of an unknown force on the resonator-amplifier of a laser, formed by a transparent photo elastic material, can lead to a change of the laser frequency by as much as several gigahertz depending on the force intensity. In addition, the rates of change of the two orthogonally polarizations of the same mode with applied force are different. Hence, the strength of the applied force can be deduced from frequency measurement of the beat signal between the two polarizations of the oscillating mode or between the mode polarized in the orthogonal direction of the force and a reference frequency of a stabilized laser.
机译:我们讨论了在单片Nd:YAG激光晶体中应力诱导的变化的应用,作为微力测量的一种可能性。实际上,在由透明的光弹性材料形成的激光器的谐振放大器上施加未知的力,会导致激光频率的变化取决于力强度,其变化幅度高达几千兆赫兹。另外,相同模式的两个正交极化随施加力的变化率是不同的。因此,可以从振荡模式的两个偏振之间或在力的正交方向上偏振的模式与稳定激光器的参考频率之间的拍信号的频率测量中推导所施加的力的强度。

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