Broadband Polarization Compensation in Silicon-On-Insulator Components Using Cladding Stress Engineering

摘要

We review the applications of cladding stress induced birefringence for controlling the polarization dependent properties in SOI waveguide components. In particular, we discuss the phase index and group index birefringence and their dispersion in this high index contrast waveguide platform, and the influence of waveguide cross-section geometry and cladding stress on these properties. Design of broadband polarization independent ring resonators using stress engineering is presented.