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Novel Hybrid Tolerance Analysis Method with Application to the Low Cost Manufacture of Edge Slot Waveguide Arrays

机译:新型混合容差分析方法在边缘槽波导阵列低成本制造中的应用

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Edge slot waveguide antenna arrays have been extensively employed in surveillance radar applications, such as the Airborne Warning and Control System (AWACS), where large volume coverage at a relatively low cost can be achieved via phase shifter electronic scanning in elevation and 360° mechanical scanning in azimuth. One of the requirements typically set forth in such applications is an extremely low side lobe level (SLL). In the edge slot array, this requires accurate dimensional tolerance control of the slot parameters: (1) width, (2) tilt angle, (3) depth, and (4) location. Modern manufacturing processes are capable of achieving extremely accurate dimensional tolerances, and it is tempting to simply specify the tightest slot tolerances possible. However, over specifying the necessary slot tolerances can artificially increase cost to the point where the ID electronically scanned antenna (ESA) edge slot waveguide array is not economically feasible in an application that could have otherwise benefited from its performance advantages. It is the job of the engineer to determine the appropriate slot tolerances required to provide the desired performance and production yield while maintaining the lowest production cost. To this end, a Monte Carlo based tolerance analysis method was developed that utilizes a standard shunt admittance transmission line model for the edge slot waveguide. The shunt admittances are derived by interpolating between a three dimensional dataset generated in Ansoft HFSS™. This hybrid tolerance analysis method provides an efficient and accurate means of determining the effects of slot dimensional tolerances on the SLL and input impedance of the edge slot waveguide array. It is the purpose of this paper to describe the tolerance analysis method in detail and illustrate its use in the low cost design and manufacture of ID ESA edge slot waveguide arrays.
机译:边缘缝隙波导天线阵列已被广泛用于监视雷达应用中,例如机载预警和控制系统(AWACS),其中可以通过高程移相器电子扫描和360°机械扫描以相对较低的成本实现大体积覆盖在方位角上。在此类应用中通常提出的要求之一是极低的旁瓣电平(SLL)。在边缘槽阵列中,这要求对槽参数进行精确的尺寸公差控制:(1)宽度,(2)倾斜角度,(3)深度和(4)位置。现代制造工艺能够实现极其精确的尺寸公差,并且试图简单地指定尽可能小的狭缝公差是很诱人的。但是,过度指定必要的缝隙公差会人为地增加成本,以至于ID电子扫描天线(ESA)边缘缝隙波导阵列在本来可以从其性能优势中受益的应用中在经济上不可行。工程师的工作是确定在保持最低生产成本的同时,提供所需性能和生产良率所需的合适的槽公差。为此,开发了基于蒙特卡洛的公差分析方法,该方法对边缘缝隙波导采用了标准分流导纳传输线模型。通过在Ansoft HFSS™中生成的三维数据集之间进行插值来得出分流导纳。这种混合公差分析方法提供了一种有效,准确的方法,可确定缝隙尺寸公差对边缘缝隙波导阵列的SLL和输入阻抗的影响。本文的目的是详细描述公差分析方法,并说明其在ID ESA边缘缝隙波导阵列的低成本设计和制造中的应用。

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