Particle analysis for uranium isotopics on swipe samples using newgeneration Cameca IMS 7f SIMS supported by SEM automateduranium detection

摘要

This study examines the detection and the analysis for uranium isotopic composition in micrometersize particles extracted from swipes using scanning electron microscopy (SEM) and secondary ion massspectrometry (SIMS) techniques. The use of low sputtering rates and high objective magnification allowssensitivity improvement of the SIMS analysis. Accurate 234/238 and 235/238 uranium isotopic ratios aredetermined in 1 μm diameter uranium oxide particles with relative precision of ± 6% and ± 0.7% (1σ),respectively.