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Magnetic and Electronic Properties of n-type (Al,Ga) co-doped Zn(Cu)O based Dilute Magnetic Semiconductors

机译:n型(Al,Ga)共掺杂Zn(Cu)O基稀磁半导体的磁学和电子学性质

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Systematic studies on the epitaxial growth and the effect of n-type (Al,Ga) doping on the magnetic and electrical properties of 2.0 % Cu doped ZnO dilute magnetic semiconducting thin films deposited on c-plane sapphire single crystals by pulsed laser deposition are reported here. An decrease in more than 3 orders of magnitude in resistivity from 2 x10~1 Ohm cm for the 2.0 % Cu doped ZnO to ~5 x10~-3 Ohm cm for Al and Ga codoped films is observed. This increase in conductivity does not show any effect on ferromagnetic ordering thus contradicting the claim of free carrier mediated exchange as being responsible for ferromagnetic ordering in these DMS systems. A bound magnetic polaron or F-center mediated exchange is a possible explanation for the origin of ferromagnetism in these ZnO based DMS thin films.
机译:系统研究了外延生长和n型(Al,Ga)掺杂对通过脉冲激光沉积在c面蓝宝石单晶上沉积的2.0%Cu掺杂的ZnO稀磁半导体薄膜的磁性和电学性质的影响这里。观察到电阻率从2.0 x Cu掺杂的ZnO的2 x10〜1 Ohm cm下降到Al和Ga共掺杂的薄膜的〜5 x10〜-3 Ohm cm超过3个数量级。电导率的这种增加不会对铁磁有序产生任何影响,因此与自由载流子介导的交换的主张相矛盾,因为这些载流子负责这些DMS系统中的铁磁有序。结合的磁极化子或F中心介导的交换是这些ZnO基DMS薄膜中铁磁性起源的可能解释。

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