Accelerated life testing on repairable systems

摘要

In this paper, we define two accelerated life models for repairable systems: the Arrhenius-exponential model and the Peck-Weibull model. Thus, we show that is possible to estimate the reliability of a product during its development with a small number of prototypes using accelerated life testing with the ability to repair when a failure occurs. This method allows us to improve the accuracy in the estimation of reliability parameters where the accuracy is linked to the number of failure times that are available. Nevertheless, these models assume "minimal repairing" such that any repair has no impact on the failure rate.