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Calibration methods for electric field probes and GTEM cells

机译:电场探头和GTEM电池的校准方法

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摘要

In this paper, two techniques are presented for in-situ calibration of an electric-field probe, in our case an asymptotic conical dipole. The first technique uses a parallel-plate probe as a reference, and measurements are performed using a spectrum analyzer. In the second technique, a network analyzer is employed to measure the two-port scattering parameters of the GTEM cell (apex of the cell) and the probe, which is installed on the floor of the cell. The antenna factor is extracted from the transmission coefficient. Measurements for both techniques are carried out in a GTEM cell. The effect of a nearby EUT on the antenna factor is investigated.
机译:在本文中,提出了两种技术用于电场探头的原位校准,在本例中为渐近锥形偶极子。第一种技术使用平行板探针作为参考,并使用频谱分析仪进行测量。在第二种技术中,使用网络分析仪来测量GTEM单元(单元的顶点)和安装在单元地板上的探针的两端口散射参数。从传输系数中提取天线系数。两种技术的测量均在GTEM单元中进行。研究了附近EUT对天线系数的影响。

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