mixed analogue-digital integrated circuits; analogue integrated circuits; integrated circuit testing; design for testability; system-on-chip; continuous time filters; fault diagnosis; regression analysis; correlation methods; onchip impulse response generation; analog signal testing; mixed-signal testing; analog linear circuit components; mixed-signal linear circuit components; impulse response signatures; DFT structure; step responses; pseudorandom patterns; onchip cross-correlation methods; autocorrelation methods; statistical methods; linear regression analysis; defect screening; continuous time filter; active stable variable filter; benchmark circuit; device under test; short resistive faults; open resistive faults;
机译:片内模拟信号生成,用于混合信号内置自检
机译:片上模拟信号生成,用于混合信号内置自测
机译:片内正弦信号生成,具有谐波消除功能,适用于模拟和混合信号BIST应用
机译:模拟和混合信号测试的片上脉冲响应生成
机译:内置自测方法,可同时测试片上模拟/混合信号系统。
机译:基于极限学习机的模拟电路故障检测测试生成算法
机译:用于模拟和混合信号测试的片上脉冲响应生成